Titlebook: Reliability of Electronic Components; A Practical Guide to Titu I. B?jenescu,Marius I. Bazu Book 1999 Springer-Verlag Berlin Heidelberg 199

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Reliability of thyristors,y of semiconductor components, including the triac, bi-directional diode switch, the silicon controlled switch (SCS), the silicon unilateral and bilateral switches (SUS, SBS) and light activated devices like the LASCR. Most recent members of the thyristor family are the complementary SCR, the progra

Radiculopathy

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Reliability of hybrid integrated circuits, In this way conductors, resistors and — until a certain degree — small capacitors and inductors are produced, integrated on a substrate. The passive elements (such as great value capacitors and, if necessary, inductors) are incorporated in the integrated circuits [8.1].

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Reliability of optoelectronic components,olithic form — are among the competitors for the lucrative visible alphanumeric display market. Reliability of such LEDs is now almost taken for granted; however the main emphasis of this chapter will be the understanding of degradation processes in LEDs and optocouplers. In Fig.10.1 a classificatio

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TSH582

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Failure analysis, on the solid physics, but on the adequate design of electronic systems or on their manufacturing on an industrial scale. The scanning electron microscope, for instance, will be mentioned only incidentally, while the habitual analysis means (such as: electrical measuring, optical microscopy and chem

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