| 書目名稱 | Microscopy of Semiconducting Materials |
| 副標題 | Proceedings of the 1 |
| 編輯 | A. G. Cullis,J. L. Hutchison |
| 視頻video | http://file.papertrans.cn/634/633444/633444.mp4 |
| 圖書封面 |  |
| 描述 | .This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14.th. conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.. |
| 出版日期 | Conference proceedings 20051st edition |
| 關鍵詞 | electron microscope; electron microscopy; integrated circuit; nanostructures; plasma processing; scanning |
| 版次 | 1 |
| doi | https://doi.org/10.1007/3-540-31915-8 |
| isbn_softcover | 978-3-642-06870-6 |
| isbn_ebook | 978-3-540-31915-3 |
| copyright | Springer-Verlag Berlin Heidelberg 2005 |
|Archiver|手機版|小黑屋|
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