找回密碼
 To register

QQ登錄

只需一步,快速開始

掃一掃,訪問微社區(qū)

打印 上一主題 下一主題

Titlebook: Design for High Performance, Low Power, and Reliable 3D Integrated Circuits; Sung Kyu Lim Book 2013 Springer Science+Business Media New Yo

[復(fù)制鏈接]
樓主: 小巷
21#
發(fā)表于 2025-3-25 06:09:31 | 只看該作者
22#
發(fā)表于 2025-3-25 07:34:04 | 只看該作者
23#
發(fā)表于 2025-3-25 15:36:28 | 只看該作者
ntegrity, and thermal analysis for 3D IC designs.Provides fuThis book provides readers with a variety of algorithms and software tools, dedicated to the physical design of through-silicon-via (TSV) based, three-dimensional integrated circuits. It describes numerous “manufacturing-ready” GDSII-level
24#
發(fā)表于 2025-3-25 17:55:30 | 只看該作者
Nikolaos L. Ninis,Stavros K. Kourkoulis with the gate count. Two approaches are proposed to alleviate TSV-to-TSV coupling, namely TSV shielding and buffer insertion. Analysis results show that both approaches are effective in reducing the TSV-caused-coupling and improving timing..The materials presented in this chapter are based on [.].
25#
發(fā)表于 2025-3-25 22:33:24 | 只看該作者
26#
發(fā)表于 2025-3-26 01:49:30 | 只看該作者
Mechanical Behaviour and Propertiesistribution within a TSV and its power wire connections. Second, we build and validate effective TSV models for current density distributions. Finally, these models are integrated with global power wires for detailed chip-scale power grid analysis..The materials presented in this chapter are based on [.].
27#
發(fā)表于 2025-3-26 04:57:11 | 只看該作者
28#
發(fā)表于 2025-3-26 12:00:05 | 只看該作者
Maria Rosa Valluzzi,Claudio Modena-power cells are vertically overlapping below the TSVs. These methods are employed in a force-directed 3D placement successfully and outperform several state-of-the-art placers published in recent literature..The materials presented in this chapter are based on [1].
29#
發(fā)表于 2025-3-26 15:28:44 | 只看該作者
Book 2013-dimensional integrated circuits. It describes numerous “manufacturing-ready” GDSII-level layouts of TSV-based 3D ICs developed with the tools covered in the book. This book will also feature sign-off level analysis of timing, power, signal integrity, and thermal analysis for 3D IC designs. Full det
30#
發(fā)表于 2025-3-26 17:38:29 | 只看該作者
 關(guān)于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務(wù)流程 影響因子官網(wǎng) 吾愛論文網(wǎng) 大講堂 北京大學(xué) Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點(diǎn)評 投稿經(jīng)驗(yàn)總結(jié) SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學(xué) Yale Uni. Stanford Uni.
QQ|Archiver|手機(jī)版|小黑屋| 派博傳思國際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-22 19:23
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權(quán)所有 All rights reserved
快速回復(fù) 返回頂部 返回列表
遂川县| 安化县| 崇义县| 额济纳旗| 大埔区| 通榆县| 巫山县| 平舆县| 石城县| 衡东县| 景宁| 泰和县| 金乡县| 怀宁县| 宁明县| 平江县| 武乡县| 龙口市| 临颍县| 永修县| 白河县| 资源县| 三明市| 南木林县| 苍梧县| 武鸣县| 定兴县| 祥云县| 枣阳市| 新邵县| 连南| 东安县| 凤城市| 高青县| 咸宁市| 中山市| 丹凤县| 青阳县| 四子王旗| 阳西县| 和静县|