Titlebook: Automated Nanohandling by Microrobots; Sergej Fatikow (Professor, Dr.-Ing. habil.) Book 2008 Springer-Verlag London 2008 automatic control

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Force Feedback for Nanohandling,cess control. With dimensions of the parts to be handled of sometimes considerably less than 100 nm and with a typical positioning accuracy in the nanometer range, nanohandling applications have detached several orders of magnitude from the operators’ macroscopic realm of experience. Powerful sensor

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Characterization and Handling of Carbon Nanotubes,45 nm transistors for the year 2007. Using electron beam lithography, structures down to 10 nm are producible. But this will be the absolute lower limit for lithographic structuring, so that new materials have to be developed for a further miniaturization of structures.

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Material Nanotesting,etration of a body with a known geometry into the material’s surface. Both the force (or load) necessary for this penetration and the depth of indentation have to be measured, either separately or simultaneously.

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1860-5168 mber of R&D groups and companies all over the world. Controlled, reproducible assembly processes on the nanoscale will enable high-throughput manufacturing of revolutionary products and open up ne978-1-84628-978-1Series ISSN 1860-5168 Series E-ISSN 2196-1735

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