SCIE期刊JOURNAL OF ELECTRONIC IMAGING 2024/2025影響因子:1.177 (J ELECTRON IMAGING) (1017-9909). (OPTICS)(光學(xué))Science Citation

悲痛

憤世嫉俗者

Submitted on: 17 March 2014. Revised on: 12 May 2014. Accepted on: 21 June 2014. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

Fulsome

追蹤

miracle

滲透

Submitted on: 24 April 2023. Revised on: 28 June 2023. Accepted on: 23 July 2023. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

熱烈的歡迎

冷峻

Submitted on: 18 December 2019. Revised on: 13 April 2020. Accepted on: 17 May 2020. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

過去分詞

cunning