SCIE期刊JOURNAL OF ELECTRONIC IMAGING 2024/2025影響因子:1.177 (J ELECTRON IMAGING) (1017-9909). (OPTICS)(光學(xué))Science Citation

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SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(20 21 REV HIST)影響因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(J ELECTRON IMAGING)影響因子@(光學(xué))學(xué)科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(20 21 REV HIST)總引論文


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(J ELECTRON IMAGING)總引論文@(光學(xué))學(xué)科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(20 21 REV HIST)影響因子


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SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(20 21 REV HIST)即時(shí)影響因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(J ELECTRON IMAGING)即時(shí)影響因子@(光學(xué))學(xué)科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(20 21 REV HIST)五年累積影響因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC IMAGING(J ELECTRON IMAGING)五年累積影響因子@(光學(xué))學(xué)科排名

Oration

Submitted on: 02 May 2011. Revised on: 18 June 2011. Accepted on: 28 July 2011. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

假裝是你

Submitted on: 01 October 2016. Revised on: 02 November 2016. Accepted on: 26 November 2016. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

extinguish

Submitted on: 29 April 2022. Revised on: 13 August 2022. Accepted on: 20 September 2022. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

疲勞

變白

Submitted on: 05 December 2005. Revised on: 26 December 2005. Accepted on: 31 January 2006. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

條約

類人猿

洞察力

沉積物

Submitted on: 14 May 2010. Revised on: 02 July 2010. Accepted on: 22 August 2010. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS