找回密碼
 To register

QQ登錄

只需一步,快速開(kāi)始

掃一掃,訪問(wèn)微社區(qū)

打印 上一主題 下一主題

Titlebook: 3D Flash Memories; Rino Micheloni Book 2016 Springer Science+Business Media Dordrecht 2016 3-D NAND Flash Memories.3-D Flash Memory Techno

[復(fù)制鏈接]
樓主: energy
31#
發(fā)表于 2025-3-26 23:05:49 | 只看該作者
s well and chapter 8 covers 3D RRAM (resistive RAM) crosspoint arrays. Visualizing 3D structures can be a challenge for the human brain: this is way all these chapters contain a lot of bird’s-eye views and cros978-94-024-1365-6978-94-017-7512-0
32#
發(fā)表于 2025-3-27 01:27:42 | 只看該作者
Bogdan R?biasz,Bart?omiej Gawe?,Iwona Skalnaand compliance with current NAND device specification. In this chapter we focus on the most straightforward 3D architecture, the Stacked one, which is built by using arrays with horizontal channels and horizontal gates: this kind of arrays is a simple stack of planar memories. Drain contacts and bit
33#
發(fā)表于 2025-3-27 05:26:41 | 只看該作者
34#
發(fā)表于 2025-3-27 09:54:24 | 只看該作者
https://doi.org/10.1007/978-3-642-95617-1fects caused by the thick gate. In fact, to make sure that electrons don’t leak away from the floating gate, gate thickness can’t be too thin. Moreover, since the number of electrons trapped inside the floating gate is less than 100 at 20?nm, losing few electrons can cause severe reliability issues
35#
發(fā)表于 2025-3-27 16:15:26 | 只看該作者
https://doi.org/10.1007/978-3-319-03677-9as seen in its entire history. Since the focus of this book is NAND Flash, we will examine the dramatic changes in (1) the vendor landscape, (2) the fundamental technology used to create the NAND memory cell, and (3) changes in usages in different segments which have made SSDs the critical growth se
36#
發(fā)表于 2025-3-27 19:12:30 | 只看該作者
https://doi.org/10.1007/978-3-319-03677-9n terms of reliability and expected performances. Starting from an analysis of basic reliability issues related to both physical and architectural aspects affecting NAND memories, the specific physical mechanisms impacting the reliability of 2D CT NAND will be addressed. Then, a review of the main p
37#
發(fā)表于 2025-3-27 23:22:56 | 只看該作者
38#
發(fā)表于 2025-3-28 05:12:29 | 只看該作者
39#
發(fā)表于 2025-3-28 07:59:24 | 只看該作者
40#
發(fā)表于 2025-3-28 13:46:01 | 只看該作者
M. Oudkerk,S. Mali,S. Tjiam,W. A. Kalendergeometries simultaneously. Transistor geometries are formed by the deep trench through a multiple polysilicon/oxide stack. The most popular cells stacks are Vertical-Channel (VC) and Vertical-Gate (VG). In VC gate-all-around type, the channel is realized by etching a hole through the layers stack in
 關(guān)于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務(wù)流程 影響因子官網(wǎng) 吾愛(ài)論文網(wǎng) 大講堂 北京大學(xué) Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點(diǎn)評(píng) 投稿經(jīng)驗(yàn)總結(jié) SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學(xué) Yale Uni. Stanford Uni.
QQ|Archiver|手機(jī)版|小黑屋| 派博傳思國(guó)際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-7 15:43
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權(quán)所有 All rights reserved
快速回復(fù) 返回頂部 返回列表
玉林市| 孟州市| 昭苏县| 德安县| 托克托县| 丁青县| 桃江县| 宜州市| 沙雅县| 宽甸| 嘉义县| 舒兰市| 龙口市| 南漳县| 南昌县| 苍南县| 辽宁省| 万荣县| 竹溪县| 郎溪县| 大田县| 收藏| 玛沁县| 禹州市| 革吉县| 青岛市| 永昌县| 公安县| 丘北县| 安国市| 南召县| 巩留县| 二连浩特市| 商洛市| 永丰县| 峡江县| 社旗县| 海口市| 九江县| 金山区| 上杭县|