Titlebook: Scanning Electron Microscopy; Physics of Image For Ludwig Reimer Book 1998Latest edition Springer-Verlag Berlin Heidelberg 1998 Rasterelekt

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Scanning Electron Microscopy978-3-540-38967-5Series ISSN 0342-4111 Series E-ISSN 1556-1534

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Springer Series in Optical Scienceshttp://image.papertrans.cn/s/image/861148.jpg

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Book 1998Latest editionimaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

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Elemental Analysis and Imaging with X-Rays,The deceleration of fast electrons in the Coulomb field of a nucleus can result in the emission of a background x-ray quantum. The de-excitation of an inner-shell ionization results either in the emission of a characteristic x-ray quantum or in the emission of an Auger electron, both of which can be used for elemental analysis.

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Crystal Structure Analysis by Diffraction,graphic emulsion or via a TV camera. At oblique incidence of the electron beam, the reflection high-energy electron diffraction (RHEED) pattern may contain Bragg diffraction spots and Kikuchi lines. ECP and EBSP are related by the theorem of reciprocity. These patterns contain information about the