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Titlebook: SOC (System-on-a-Chip) Testing for Plug and Play Test Automation; Krishnendu Chakrabarty Book 2002 Springer Science+Business Media New Yor

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發(fā)表于 2025-3-21 19:37:18 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
編輯Krishnendu Chakrabarty
視頻videohttp://file.papertrans.cn/861/860206/860206.mp4
叢書名稱Frontiers in Electronic Testing
圖書封面Titlebook: SOC (System-on-a-Chip) Testing for Plug and Play Test Automation;  Krishnendu Chakrabarty Book 2002 Springer Science+Business Media New Yor
描述.System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. ..SOC (System-on-a-Chip) Testing for Plug and Play Test Automation. is an edited work containing thirteen contributions that address various aspects of SOC testing. ..SOC (System-on-a-Chip) Testing for Plug and Play Test Automation. is a valuable reference for researchers and students interested in various aspects of SOC testing. .
出版日期Book 2002
關(guān)鍵詞Signal; Standard; algorithms; automation; data compression; development; integrated circuit; interconnect; m
版次1
doihttps://doi.org/10.1007/978-1-4757-6527-4
isbn_softcover978-1-4419-5307-0
isbn_ebook978-1-4757-6527-4Series ISSN 0929-1296
issn_series 0929-1296
copyrightSpringer Science+Business Media New York 2002
The information of publication is updating

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沙發(fā)
發(fā)表于 2025-3-21 22:48:13 | 只看該作者
978-1-4419-5307-0Springer Science+Business Media New York 2002
板凳
發(fā)表于 2025-3-22 02:32:28 | 只看該作者
地板
發(fā)表于 2025-3-22 05:08:27 | 只看該作者
Frontiers in Electronic Testinghttp://image.papertrans.cn/s/image/860206.jpg
5#
發(fā)表于 2025-3-22 10:33:59 | 只看該作者
https://doi.org/10.1007/978-1-4757-6527-4Signal; Standard; algorithms; automation; data compression; development; integrated circuit; interconnect; m
6#
發(fā)表于 2025-3-22 13:01:03 | 只看該作者
7#
發(fā)表于 2025-3-22 19:28:34 | 只看該作者
Book 2002Automation. is an edited work containing thirteen contributions that address various aspects of SOC testing. ..SOC (System-on-a-Chip) Testing for Plug and Play Test Automation. is a valuable reference for researchers and students interested in various aspects of SOC testing. .
8#
發(fā)表于 2025-3-22 22:24:08 | 只看該作者
0929-1296 Play Test Automation. is an edited work containing thirteen contributions that address various aspects of SOC testing. ..SOC (System-on-a-Chip) Testing for Plug and Play Test Automation. is a valuable reference for researchers and students interested in various aspects of SOC testing. .978-1-4419-5307-0978-1-4757-6527-4Series ISSN 0929-1296
9#
發(fā)表于 2025-3-23 03:23:55 | 只看該作者
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發(fā)表于 2025-3-23 08:27:32 | 只看該作者
The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICsm the expanded and scheduled test protocols and the (so far untouched) test patterns. This paper describes and formalizes the notion of test protocols and the algorithms for test protocol expansion and scheduling. A running example is featured throughout the paper. We also elaborate on the industrial usage of the concepts described.
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