找回密碼
 To register

QQ登錄

只需一步,快速開始

掃一掃,訪問微社區(qū)

打印 上一主題 下一主題

Titlebook: SOC (System-on-a-Chip) Testing for Plug and Play Test Automation; Krishnendu Chakrabarty Book 2002 Springer Science+Business Media New Yor

[復(fù)制鏈接]
查看: 9055|回復(fù): 55
樓主
發(fā)表于 2025-3-21 19:37:18 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
編輯Krishnendu Chakrabarty
視頻videohttp://file.papertrans.cn/861/860206/860206.mp4
叢書名稱Frontiers in Electronic Testing
圖書封面Titlebook: SOC (System-on-a-Chip) Testing for Plug and Play Test Automation;  Krishnendu Chakrabarty Book 2002 Springer Science+Business Media New Yor
描述.System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. ..SOC (System-on-a-Chip) Testing for Plug and Play Test Automation. is an edited work containing thirteen contributions that address various aspects of SOC testing. ..SOC (System-on-a-Chip) Testing for Plug and Play Test Automation. is a valuable reference for researchers and students interested in various aspects of SOC testing. .
出版日期Book 2002
關(guān)鍵詞Signal; Standard; algorithms; automation; data compression; development; integrated circuit; interconnect; m
版次1
doihttps://doi.org/10.1007/978-1-4757-6527-4
isbn_softcover978-1-4419-5307-0
isbn_ebook978-1-4757-6527-4Series ISSN 0929-1296
issn_series 0929-1296
copyrightSpringer Science+Business Media New York 2002
The information of publication is updating

書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation影響因子(影響力)




書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation影響因子(影響力)學(xué)科排名




書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation網(wǎng)絡(luò)公開度




書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation被引頻次




書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation被引頻次學(xué)科排名




書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation年度引用




書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation年度引用學(xué)科排名




書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation讀者反饋




書目名稱SOC (System-on-a-Chip) Testing for Plug and Play Test Automation讀者反饋學(xué)科排名




單選投票, 共有 1 人參與投票
 

0票 0.00%

Perfect with Aesthetics

 

1票 100.00%

Better Implies Difficulty

 

0票 0.00%

Good and Satisfactory

 

0票 0.00%

Adverse Performance

 

0票 0.00%

Disdainful Garbage

您所在的用戶組沒有投票權(quán)限
沙發(fā)
發(fā)表于 2025-3-21 22:48:13 | 只看該作者
978-1-4419-5307-0Springer Science+Business Media New York 2002
板凳
發(fā)表于 2025-3-22 02:32:28 | 只看該作者
地板
發(fā)表于 2025-3-22 05:08:27 | 只看該作者
Frontiers in Electronic Testinghttp://image.papertrans.cn/s/image/860206.jpg
5#
發(fā)表于 2025-3-22 10:33:59 | 只看該作者
https://doi.org/10.1007/978-1-4757-6527-4Signal; Standard; algorithms; automation; data compression; development; integrated circuit; interconnect; m
6#
發(fā)表于 2025-3-22 13:01:03 | 只看該作者
7#
發(fā)表于 2025-3-22 19:28:34 | 只看該作者
Book 2002Automation. is an edited work containing thirteen contributions that address various aspects of SOC testing. ..SOC (System-on-a-Chip) Testing for Plug and Play Test Automation. is a valuable reference for researchers and students interested in various aspects of SOC testing. .
8#
發(fā)表于 2025-3-22 22:24:08 | 只看該作者
0929-1296 Play Test Automation. is an edited work containing thirteen contributions that address various aspects of SOC testing. ..SOC (System-on-a-Chip) Testing for Plug and Play Test Automation. is a valuable reference for researchers and students interested in various aspects of SOC testing. .978-1-4419-5307-0978-1-4757-6527-4Series ISSN 0929-1296
9#
發(fā)表于 2025-3-23 03:23:55 | 只看該作者
10#
發(fā)表于 2025-3-23 08:27:32 | 只看該作者
The Role of Test Protocols in Automated Test Generation for Embedded-Core-Based System ICsm the expanded and scheduled test protocols and the (so far untouched) test patterns. This paper describes and formalizes the notion of test protocols and the algorithms for test protocol expansion and scheduling. A running example is featured throughout the paper. We also elaborate on the industrial usage of the concepts described.
 關(guān)于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務(wù)流程 影響因子官網(wǎng) 吾愛論文網(wǎng) 大講堂 北京大學(xué) Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點評 投稿經(jīng)驗總結(jié) SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學(xué) Yale Uni. Stanford Uni.
QQ|Archiver|手機版|小黑屋| 派博傳思國際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-7 15:49
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權(quán)所有 All rights reserved
快速回復(fù) 返回頂部 返回列表
宁远县| 武乡县| 基隆市| 北宁市| 长兴县| 迭部县| 台安县| 师宗县| 安溪县| 阜宁县| 清水河县| 北票市| 斗六市| 通海县| 萝北县| 太保市| 甘肃省| 珠海市| 多伦县| 桑日县| 泗洪县| 桑日县| 怀柔区| 安阳县| 绿春县| 新民市| 弋阳县| 东乡族自治县| 青浦区| 和政县| 孙吴县| 沾化县| 建始县| 中方县| 平顶山市| 德兴市| 潞城市| 阿拉尔市| 北票市| 阳曲县| 昔阳县|