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Titlebook: Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces; P. K. Larsen,P. J. Dobson Book 1988 Plenum Press,

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發(fā)表于 2025-3-21 17:50:59 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書(shū)目名稱Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces
編輯P. K. Larsen,P. J. Dobson
視頻videohttp://file.papertrans.cn/825/824694/824694.mp4
叢書(shū)名稱NATO Science Series B:
圖書(shū)封面Titlebook: Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces;  P. K. Larsen,P. J. Dobson Book 1988 Plenum Press,
描述This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960‘s made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazin
出版日期Book 1988
關(guān)鍵詞crystal; crystallography; electron; electron microscopy; microscopy; transmission electron microscopy
版次1
doihttps://doi.org/10.1007/978-1-4684-5580-9
isbn_softcover978-1-4684-5582-3
isbn_ebook978-1-4684-5580-9Series ISSN 0258-1221
issn_series 0258-1221
copyrightPlenum Press, New York 1988
The information of publication is updating

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沙發(fā)
發(fā)表于 2025-3-21 21:44:48 | 只看該作者
Diffraction from Stepped Surfacesssarily an intermediate state, so that the study of stepped surfaces is needed for a description of any growth or dissolution process. Only with this information other properties like electron mobility due to roughness scattering at surfaces or heterogeneous catalysis due to active sites at steps may be studied in detail.
板凳
發(fā)表于 2025-3-22 00:34:22 | 只看該作者
Temperature Dependence of the Surface Disorder on Ge(001) Due to Ar+ Ion Bombardmentviz. recoil implantation or ion beam mixing of surface impurities into the topmost atomic layers of the target and creation of radiation damage. The former can be eliminated by prolonged bombardment, the latter which is foremost important with crystalline targets will be the subject of the present paper.
地板
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Inelastic Scattering and Secondary Electron Emission under Resonance Conditions in RHEED from Pt(111d an anomalous enhancement of diffraction intensities from ZnS under certain experimental conditions. Miyake et al. [2] recognized these conditions to be fulfilled whenever a diffracted beam, just before emergence from the crystal, is propagating nearly parallel to the surface. Kohra et al. [3] show
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發(fā)表于 2025-3-22 20:17:54 | 只看該作者
A Note on the Bloch Wave and Integral Formulations of RHEED Theoryst common are the Bloch wave treatment and the differential or integral operator approach, the latter can be compared with the multi-slice formulation or the Howie-Whelan equations for transmission.[1] In either case the introduction of the backscattered wave may be seen as a crucial step.
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發(fā)表于 2025-3-22 23:27:03 | 只看該作者
Diffraction from Disordered Surfaces: An Overviewfor investigating the crystallography and microstructure of surfaces and very thin films. Diffraction gives a statistical view of disorder rather than a local picture, as would be obtained, for example, in a scanning tunneling microscope. Many processes occurring at surfaces, such as growth, phase t
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發(fā)表于 2025-3-23 02:50:46 | 只看該作者
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發(fā)表于 2025-3-23 06:17:44 | 只看該作者
Diffraction from Stepped Surfacesbe varified experimentally or a density of steps has to be indicated. On the other hand the presence and distribution of atomic steps is essential for many changes at surfaces. Both during etching or reaction at surfaces (like oxidation of silicon) and during crystal growth a stepped surface is nece
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