Titlebook: Nanometer Technology Designs; High-Quality Delay T Mohammad Tehranipoor,Nisar Ahmed Book 2008 Springer-Verlag US 2008 ATPG.at-speed tests.d

mobility

書目名稱Nanometer Technology Designs影響因子(影響力)




書目名稱Nanometer Technology Designs影響因子(影響力)學科排名




書目名稱Nanometer Technology Designs網(wǎng)絡(luò)公開度




書目名稱Nanometer Technology Designs網(wǎng)絡(luò)公開度學科排名




書目名稱Nanometer Technology Designs被引頻次




書目名稱Nanometer Technology Designs被引頻次學科排名




書目名稱Nanometer Technology Designs年度引用




書目名稱Nanometer Technology Designs年度引用學科排名




書目名稱Nanometer Technology Designs讀者反饋




書目名稱Nanometer Technology Designs讀者反饋學科排名

可轉(zhuǎn)變

分散

At-speed Test Challenges for Nanometer Technology Designs,wer scan design and pattern generation. Test data run over many dice and wafers can provide valuable diagnostic information that helps foundries and designers ramp up their yields. In this sense, DFT meets DFM and becomes a critical element in the attempt to mitigate process variability.

Foolproof

Hybrid Scan-Based Transition Delay Test,, in industry, is often called LOS+LOC. It provides a fault coverage higher than that of LOS but the design effort still remains high since the scan enable to all scan chains must be timing closed because of using LOS method.

Mercurial

POLYP

Avoiding Functionally Untestable Faults,t coverage by increasing the chance of detecting non-modeled faults or filled by compression tools to obtain the highest compression to reduce test data volume and test time. However, filling these don‘t-care bits without considering the functionally untestable faults can cause yield loss.

凹室

吃掉

http://image.papertrans.cn/n/image/660848.jpg

Carcinoma

黑豹

Screening Small Delay Defects,ts. Resistive open and short are two such defects that cause timing or logic failures in the design. Such defects can cause gross or small delay defects depending on the size of their resistance. It is proven that the population of such defects increases as technology scales, thus increasing small delay defects.