Titlebook: Microelectronics Manufacturing Diagnostics Handbook; Abraham H. Landzberg Book 1993 Springer Science+Business Media New York 1993 diagnosi

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Final Test,f assembly. This section will discuss some of the techniques used to achieve this process. This chapter will concentrate on the semiconductor level of test as opposed to card or system level test. The techniques in many cases apply to the higher levels of assembly testing as well.

MOT

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Failure Analysis of Semiconductor Devices,nsistors (FET). Present integrated circuit complexity has increased, and device geometries have decreased to submicron dimensions. With this increase in manufacturing complexity, needs dictate state-of-the-art analytical capabilities to support product production and to continue to assure reliabilit

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Materials and Chemical Analysis of Electronic Devices,vices involves hundreds of operations, each individual manufacturing step must be controlled within very small tolerances to produce a large percentage of devices with good performance, i.e., there must be an economically meaningful product yield. The procedures defined in the other chapters of this

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Modeling for Manufacturing Diagnostics,ndesirable) results to input parameters or conditions. This process is most efficient if a model of the system is used, together with well designed experiments. As it is used in many different contexts with different meanings, we define the term model to mean: an executable implementation of theoret

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MERIT

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Dignant

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https://doi.org/10.1007/978-1-4615-2029-0diagnosis; manufacturing; material; reliability; semiconductor devices