Titlebook: Materials and Reliability Handbook for Semiconductor Optical and Electron Devices; Osamu Ueda,Stephen J. Pearton Book 2013 Springer Scienc

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Radiation-Enhanced Dislocation Glide: The Current Status of Researchts the REDG is identified as 30°-Si(g) partial dislocation. Nevertheless, the driving force for the REDG in 4H-SiC is not the mechanical stress as in usual cases but an anomalous reversal of the sign of the Shockley stacking-fault (SSF) energy depending on the radiation intensity. An attempt was mad

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Mechanism of Defect Reactions in Semiconductorsing instability mechanism and phonon-kick mechanism. Energy released by a carrier capture can enhance the next capture, and then for high carrier density, a positive feedback may occur to create a rapid increase of lattice vibrations, which then causes defect reactions.

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Novel Dielectrics for GaN Device Passivation and Improved Reliabilityhange in HEMT behavior over 5 months aging. The use of MOSFETs could allow the use of complementary devices, thus producing less power consumption and simpler circuit design. The same novel oxides employed for alleviating many of the problems encountered in current Schottky-based devices were succes

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Book 2013ability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The .Handbook. emphasizes physical mechanisms rath

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William J. Roeschone-semester textbook or a reference book. Readers who are more interested in applications may skip Chapter 1 and peruse through the rest of the book with ease..978-3-030-96472-6978-3-030-96470-2Series ISSN 2193-472X Series E-ISSN 2193-4738

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Mitsuo Fukudaand in technology—such as finance, airline transport, urban development and global trade.Topics and Features: begins with a clear overview chapter to introduce this interdisciplinary field; discusses the classi978-1-4471-6034-2978-1-84996-396-1

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Aland K. Chin,Rick K. Bertaskardependencies, associations, and relationships of entities in different kinds of networks...The book is intended for researchers as well as interested readers working in network science who want to learn more a978-3-030-26816-9978-3-030-26814-5

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technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The .Handbook. emphasizes physical mechanisms rath978-1-4939-0119-7978-1-4614-4337-7