| 書目名稱 | Materials and Reliability Handbook for Semiconductor Optical and Electron Devices |
| 編輯 | Osamu Ueda,Stephen J. Pearton |
| 視頻video | http://file.papertrans.cn/626/625827/625827.mp4 |
| 概述 | Provides the first handbook to cover all aspects of compound semiconductor device reliability.Systematically describes research results on reliability and materials issues of both optical and electron |
| 圖書封面 |  |
| 描述 | .Materials and Reliability Handbook for Semiconductor Optical and Electron Devices. provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. .The. Handbook .addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The .Handbook. emphasizes physical mechanisms rath |
| 出版日期 | Book 2013 |
| 關(guān)鍵詞 | AlGaN/GaN High Electron Mobility Transistors; Devices failure analysis; Devices reliability; Electrical |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-1-4614-4337-7 |
| isbn_softcover | 978-1-4939-0119-7 |
| isbn_ebook | 978-1-4614-4337-7 |
| copyright | Springer Science+Business Media New York 2013 |
|Archiver|手機(jī)版|小黑屋|
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