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Titlebook: Machine Learning in VLSI Computer-Aided Design; Ibrahim (Abe) M. Elfadel,Duane S. Boning,Xin Li Book 2019 Springer Nature Switzerland AG 2

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發(fā)表于 2025-3-21 17:04:08 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱Machine Learning in VLSI Computer-Aided Design
編輯Ibrahim (Abe) M. Elfadel,Duane S. Boning,Xin Li
視頻videohttp://file.papertrans.cn/621/620705/620705.mp4
概述Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability.Discusses the use of machine learn
圖書封面Titlebook: Machine Learning in VLSI Computer-Aided Design;  Ibrahim (Abe) M. Elfadel,Duane S. Boning,Xin Li Book 2019 Springer Nature Switzerland AG 2
描述.This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. .Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability;.Discusses the use of machine learning techniques in the context of analog and digital synthesis;.Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions;.Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs...From the Foreword. .As the se
出版日期Book 2019
關(guān)鍵詞VLSI Design; VLSI Verification; VLSI Testing; VLSI Analog Circuits; CMOS VLSI Design
版次1
doihttps://doi.org/10.1007/978-3-030-04666-8
isbn_ebook978-3-030-04666-8
copyrightSpringer Nature Switzerland AG 2019
The information of publication is updating

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發(fā)表于 2025-3-21 21:54:07 | 只看該作者
Ibrahim (Abe) M. Elfadel,Duane S. Boning,Xin LiProvides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability.Discusses the use of machine learn
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Springer Nature Switzerland AG 2019
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發(fā)表于 2025-3-22 11:46:16 | 只看該作者
A Preliminary Taxonomy for Machine Learning in VLSI CAD,ception. The purpose of this book is to bring to the interested reader a cross-section of the connections between existing and emerging machine learning methods and VLSI computer aided design (CAD). In this brief introduction, we begin with a high-level taxonomy of machine learning methods. We then
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發(fā)表于 2025-3-23 00:11:42 | 只看該作者
Machine Learning in Physical Verification, Mask Synthesis, and Physical Design as physical design, mask synthesis, and physical verification are critical to guarantee fast design closure and manufacturability. Recent advances in machine learning provide various new opportunities and approaches to tackle these challenges. This chapter will discuss several applications of machi
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Machine Learning Approaches for IC Manufacturing Yield Enhancementinterest in machine learning and data mining techniques to improve yield to take advantage of this increasing volume of data. In this chapter, we introduce machine learning yield models for integrated circuit (IC) manufacturing yield enhancement. Challenges in this area include class imbalance due t
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