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Titlebook: MICC 90; Moscow International I. N. Fridlyander,V. I. Kostikov Book 1991 Elsevier Science Publishers Ltd 1991 X-ray.advanced materials.cera

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41#
發(fā)表于 2025-3-28 18:32:39 | 只看該作者
Samuel J. Dastindocuments labeled with the keyword lectin, and are present in considerably less numbers, namely about 6000 in CA, about 8000 in BA, and about 5000 in .. In summary, there is considerable knowledge in the lectin field coupled with a notable lack of knowledge; this is reflected in the increasing inter
42#
發(fā)表于 2025-3-28 19:44:48 | 只看該作者
L. J. Cohen Ph.D.een made to relate the biochemical or pathobiochemical regulatory role of glycoproteins to the total content of distinct sugar residues, e.g., of Neu5Ac or fucose in glycoprotein mixtures. With the technique described here it is possible to selectively analyze the glycans of defined glycoproteins wi
43#
發(fā)表于 2025-3-28 23:36:06 | 只看該作者
44#
發(fā)表于 2025-3-29 03:47:36 | 只看該作者
45#
發(fā)表于 2025-3-29 07:19:42 | 只看該作者
46#
發(fā)表于 2025-3-29 15:27:00 | 只看該作者
47#
發(fā)表于 2025-3-29 19:08:09 | 只看該作者
Robert M. Jonesnteraction of the magnetic field and the charge carriers in the semiconductor is far from being simple despite the validity of the Lorenz force expression. Namely, due to mutual interaction of the carriers, the scattering on the atoms of the crystal lattice, recombination and generation, and even th
48#
發(fā)表于 2025-3-29 21:20:13 | 只看該作者
49#
發(fā)表于 2025-3-30 01:08:23 | 只看該作者
Tālis Millers,Jānis Grabis,Ilmārs Zālītes is usually performed in the frequency domain. To that aspect of the noise analysis will be devoted special attention and new quantities will be introduced which are used for noise quantification in electronic circuits and systems. Among them the most important are the noise bandwidth, the equivale
50#
發(fā)表于 2025-3-30 04:10:42 | 只看該作者
N. A. Kulakova,A. M. Frishberg,A. T. Kaverovated which is why, in this chapter, we will elaborate the method on a set of simple circuits gathering knowledge at the same time on the noise properties of these circuits. When considering BJT and JFET noise, in the previous chapter we already established the general properties of the basic CE and
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