| 書目名稱 | Lifetime Reliability-aware Design of Integrated Circuits |
| 編輯 | Mohsen Raji,Behnam Ghavami |
| 視頻video | http://file.papertrans.cn/586/585964/585964.mp4 |
| 概述 | Provides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits.Describes state-of-the art aging- and process variation-aware CAD algorithms.Includes reliability |
| 圖書封面 |  |
| 描述 | .This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits. ??. |
| 出版日期 | Book 2023 |
| 關(guān)鍵詞 | reliability of digital systems; reliability of nano-scale CMOS digital circuits; Reliability Analysis |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-031-15345-7 |
| isbn_softcover | 978-3-031-15347-1 |
| isbn_ebook | 978-3-031-15345-7 |
| copyright | The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl |
|Archiver|手機(jī)版|小黑屋|
派博傳思國際
( 京公網(wǎng)安備110108008328)
GMT+8, 2025-10-12 11:45
發(fā)表于 2025-3-21 19:30:35
