| 書目名稱 | Introduction to IDDQ Testing | | 編輯 | Sreejit Chakravarty,Paul J. Thadikaran | | 視頻video | http://file.papertrans.cn/474/473768/473768.mp4 | | 叢書名稱 | Frontiers in Electronic Testing | | 圖書封面 |  | | 描述 | Testing techniques for VLSI circuits are undergoing manyexciting changes. The predominant method for testing digital circuitsconsists of applying a set of input stimuli to the IC and monitoringthe logic levels at primary outputs. If, for one or more inputs, thereis a discrepancy between the observed output and the expected outputthen the IC is declared to be defective. .A new approach to testing digital circuits, which has come to be knownas I.DDQ. testing, has been actively researched for the lastfifteen years. In I.DDQ. testing, the steady state supplycurrent, rather than the logic levels at the primary outputs, ismonitored. Years of research suggests that I.DDQ. testing cansignificantly improve the quality and reliability of fabricatedcircuits. This has prompted many semiconductor manufacturers to adoptthis testing technique, among them Philips Semiconductors, FordMicroelectronics, Intel, Texas Instruments, LSI Logic,Hewlett-Packard, SUN microsystems, Alcatel, and SGS Thomson. .This increase in the use of I.DDQ. testing should be of interestto three groups of individuals associated with the IC business:Product Managers and Test Engineers, CAD Tool Vendors and CircuitDesigners. . | | 出版日期 | Book 1997 | | 關(guān)鍵詞 | LSI; VLSI; circuit design; computer-aided design (CAD); diagnosis; integrated circuit; logic; microsystems | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4615-6137-8 | | isbn_softcover | 978-1-4613-7812-9 | | isbn_ebook | 978-1-4615-6137-8Series ISSN 0929-1296 | | issn_series | 0929-1296 | | copyright | Springer Science+Business Media New York 1997 |
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