| 書(shū)目名稱(chēng) | High-Resolution X-Ray Scattering from Thin Films and Multilayers |
| 編輯 | Václav Holy,Ullrich Pietsch,Tilo Baumbach |
| 視頻video | http://file.papertrans.cn/427/426738/426738.mp4 |
| 概述 | First monograph on thin-layer and multilayer x-ray analysis.Up-to-date review.Critical overview of the literature |
| 叢書(shū)名稱(chēng) | Springer Tracts in Modern Physics |
| 圖書(shū)封面 |  |
| 描述 | This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:.thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis. |
| 出版日期 | Book 19991st edition |
| 關(guān)鍵詞 | Dispersion; crystal; diffraction; lattice parameter; scattering; thin films |
| 版次 | 1 |
| doi | https://doi.org/10.1007/BFb0109385 |
| isbn_ebook | 978-3-540-49625-0Series ISSN 0081-3869 Series E-ISSN 1615-0430 |
| issn_series | 0081-3869 |
| copyright | Springer-Verlag Berlin Heidelberg 1999 |
|Archiver|手機(jī)版|小黑屋|
派博傳思國(guó)際
( 京公網(wǎng)安備110108008328)
GMT+8, 2025-10-13 14:16
發(fā)表于 2025-3-21 16:08:34
