| 書目名稱 | High-Resolution X-Ray Scattering from Thin Films and Multilayers |
| 編輯 | Václav Holy,Ullrich Pietsch,Tilo Baumbach |
| 視頻video | http://file.papertrans.cn/427/426738/426738.mp4 |
| 概述 | First monograph on thin-layer and multilayer x-ray analysis.Up-to-date review.Critical overview of the literature |
| 叢書名稱 | Springer Tracts in Modern Physics |
| 圖書封面 |  |
| 描述 | This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems:.thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis. |
| 出版日期 | Book 19991st edition |
| 關(guān)鍵詞 | Dispersion; crystal; diffraction; lattice parameter; scattering; thin films |
| 版次 | 1 |
| doi | https://doi.org/10.1007/BFb0109385 |
| isbn_ebook | 978-3-540-49625-0Series ISSN 0081-3869 Series E-ISSN 1615-0430 |
| issn_series | 0081-3869 |
| copyright | Springer-Verlag Berlin Heidelberg 1999 |
|Archiver|手機版|小黑屋|
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