Titlebook: High-Frequency GaN Electronic Devices; Patrick Fay,Debdeep Jena,Paul Maki Book 2020 Springer Nature Switzerland AG 2020 Gallium Nitride El

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Non-contact Metrology for mm-Wave and THz Electronics,s physical contact with the test wafer by injecting the test signals via a quasi-optical link through an extended hemispherical focusing lens onto the test wafer’s coplanar waveguide environment. Optimized on-wafer butterfly antennas ensure effective radiative coupling onto and out of the test wafer

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Indelible

Patrick Fay,Debdeep Jena,Paul Makiom the real-world application. The author describes a SDVRP with stochastic customer requests often addressed in the literature, ?and then shows in detail how this problem can be modeled as a Markov decision pr978-3-319-85681-0978-3-319-55511-9Series ISSN 1387-666X Series E-ISSN 2698-5489

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J. Khurgin,D. Jenaof developed algorithms. The developed technique is applied to two types of blind experimental data, which are collected both in a laboratory and in the field. The result for the blind backscattering experimental data collected in the field addresses a real world problem of imaging of shallow explosives.978-1-4899-9530-8978-1-4419-7805-9

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Samuel James Bader,Keisuke Shinohara,Alyosha Molnarof developed algorithms. The developed technique is applied to two types of blind experimental data, which are collected both in a laboratory and in the field. The result for the blind backscattering experimental data collected in the field addresses a real world problem of imaging of shallow explosives.978-1-4899-9530-8978-1-4419-7805-9

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Zhichao Yang,Digbijoy N. Nath,Yuewei Zhang,Sriram Krishnamoorthy,Jacob Khurgin,Siddharth Rajanof developed algorithms. The developed technique is applied to two types of blind experimental data, which are collected both in a laboratory and in the field. The result for the blind backscattering experimental data collected in the field addresses a real world problem of imaging of shallow explosives.978-1-4899-9530-8978-1-4419-7805-9