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Titlebook: Gain-Cell Embedded DRAMs for Low-Power VLSI Systems-on-Chip; Pascal Meinerzhagen,Adam Teman,Alexander Fish Book 2018 Springer Internationa

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樓主: CILIA
21#
發(fā)表于 2025-3-25 06:44:36 | 只看該作者
Flow Models Studies of Heart Valves,Simulations show successful sub-.. operation for a 2T GC-eDRAM array in 0.18?μm CMOS. Furthermore, a 2T GC-eDRAM array implemented in a scaled 40?nm CMOS can be operated successfully down to the near-.. domain, while simultaneous aggressive technology and voltage scaling to the sub-.. domain are not recommended.
22#
發(fā)表于 2025-3-25 10:29:32 | 只看該作者
Embedded Memories: Introduction,tems, are presented next. Finally, a short review of the state-of-the-art embedded memory technologies, including static random-access memory (SRAM) and embedded dynamic random-access memory (eDRAM), is provided, before closing the chapter with a book outline.
23#
發(fā)表于 2025-3-25 14:43:53 | 只看該作者
Aggressive Technology and Voltage Scaling (Down to the Subthreshold Domain),Simulations show successful sub-.. operation for a 2T GC-eDRAM array in 0.18?μm CMOS. Furthermore, a 2T GC-eDRAM array implemented in a scaled 40?nm CMOS can be operated successfully down to the near-.. domain, while simultaneous aggressive technology and voltage scaling to the sub-.. domain are not recommended.
24#
發(fā)表于 2025-3-25 19:51:31 | 只看該作者
25#
發(fā)表于 2025-3-25 20:57:33 | 只看該作者
Conventional GC-eDRAMs Scaled to Near-Threshold Voltage (NTV),modes, voltage scaling can improve the retention time. Briefly, this chapter shows that a conventional 2T GC bitcell and array organization can be operated at a near-.. voltage (NTV), and that a WBL control scheme during retention modes can improve the retention time under voltage scaling.
26#
發(fā)表于 2025-3-26 02:50:58 | 只看該作者
27#
發(fā)表于 2025-3-26 06:44:42 | 只看該作者
28#
發(fā)表于 2025-3-26 10:27:26 | 只看該作者
Conclusions,d (sub-..) voltages to power-aware high-performance systems operated at near-threshold (near-..) or nominal supply voltages. It was shown that the key to achieve energy efficiency in GC-eDRAM is a proper understanding and control of the factors that determine the data retention time and its statistical distribution.
29#
發(fā)表于 2025-3-26 16:26:42 | 只看該作者
30#
發(fā)表于 2025-3-26 17:45:49 | 只看該作者
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