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Titlebook: Gain-Cell Embedded DRAMs for Low-Power VLSI Systems-on-Chip; Pascal Meinerzhagen,Adam Teman,Alexander Fish Book 2018 Springer Internationa

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發(fā)表于 2025-3-21 16:10:12 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱Gain-Cell Embedded DRAMs for Low-Power VLSI Systems-on-Chip
編輯Pascal Meinerzhagen,Adam Teman,Alexander Fish
視頻videohttp://file.papertrans.cn/381/380322/380322.mp4
概述Provides novel gain-cell embedded DRAM (GC-eDRAM) designs for various low-power VLSI SoC applications;.Models the statistical retention time distribution of GC-eDRAM and validates the model by silicon
圖書封面Titlebook: Gain-Cell Embedded DRAMs for Low-Power VLSI Systems-on-Chip;  Pascal Meinerzhagen,Adam Teman,Alexander Fish Book 2018 Springer Internationa
描述.This book pioneers the field of gain-cell embedded DRAM (GC-eDRAM) design for low-power VLSI systems-on-chip (SoCs). Novel GC-eDRAMs are specifically designed and optimized for a range of low-power VLSI SoCs, ranging from ultra-low power to power-aware high-performance applications. After a detailed review of prior-art GC-eDRAMs, an analytical retention time distribution model is introduced and validated by silicon measurements, which is key for low-power GC-eDRAM design. The book then investigates supply voltage scaling and near-threshold voltage (NTV) operation of a conventional gain cell (GC), before presenting novel GC circuit and assist techniques for NTV operation, including a 3-transistor full transmission-gate write port, reverse body biasing (RBB), and a replica technique for optimum refresh timing. Next, conventional GC bitcells are evaluated under aggressive technology and voltage scaling (down to the subthreshold domain), before novel bitcells for aggressively scaled CMOS nodes and soft-error tolerance as presented, including a 4-transistor GC with partial internal feedback and a 4-transistor GC with built-in redundancy..
出版日期Book 2018
關鍵詞Memory Systems; Memory for VLSI; embedded DRAM memory; embedded memory design; memory optimization; error
版次1
doihttps://doi.org/10.1007/978-3-319-60402-2
isbn_softcover978-3-319-86855-4
isbn_ebook978-3-319-60402-2
copyrightSpringer International Publishing AG 2018
The information of publication is updating

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發(fā)表于 2025-3-21 23:45:08 | 只看該作者
Gain-Cell eDRAMs (GC-eDRAMs): Review of Basics and Prior Art, then provides a detailed review of the state-of-the-art of GC-eDRAM design prior to the publication of this book, identifying bitcell and peripheral circuit techniques, as well as main target applications. The review of the state-of-the-art GC-eDRAMs unveils the predominant high-performance process
板凳
發(fā)表于 2025-3-22 02:43:42 | 只看該作者
Retention Time Modeling: The Key to Low-Power GC-eDRAMs,d 1-transistor-1-capacitor (1T-1C) eDRAM for reasons, such as high storage density, low bitcell leakage, logic compatibility, and suitability for two-port memories. The major drawbacks of GC-eDRAMs are their limited data retention times (RTs) and the large spread of RT across an array (Chun et al.,
地板
發(fā)表于 2025-3-22 05:50:32 | 只看該作者
Conventional GC-eDRAMs Scaled to Near-Threshold Voltage (NTV),cuits. This chapter argues that embedded memories should follow the trend of voltage scaling to the near-.. domain in order to facilitate SoC integration. In this context, the impact of supply voltage scaling on the retention time of a conventional 2T GC-eDRAM array is analyzed, and it is further sh
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發(fā)表于 2025-3-23 00:24:23 | 只看該作者
Conclusions,VLSI SoCs. The presented GC-eDRAM circuits were targeted at a broad range of low-power VLSI SoCs, from ultra-low power systems operated at subthreshold (sub-..) voltages to power-aware high-performance systems operated at near-threshold (near-..) or nominal supply voltages. It was shown that the key
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發(fā)表于 2025-3-23 08:08:23 | 只看該作者
Advances in Cardiac Signal Processing then provides a detailed review of the state-of-the-art of GC-eDRAM design prior to the publication of this book, identifying bitcell and peripheral circuit techniques, as well as main target applications. The review of the state-of-the-art GC-eDRAMs unveils the predominant high-performance process
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