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Titlebook: Evolution of Thin Film Morphology; Modeling and Simulat Matthew Pelliccione,Toh-Ming Lu Book 20081st edition Springer-Verlag New York 2008

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21#
發(fā)表于 2025-3-25 05:47:04 | 只看該作者
Beitr?ge zur ProduktionswirtschaftThe study of self-affine surfaces forms the basis for the continuum study of all thin film rough surfaces. It is in the context of self-affine surfaces where the description of the surface is simplest and most elegant, and the ideas used to describe self-affine surfaces can be generalized to more complex surfaces such as mounded surfaces.
22#
發(fā)表于 2025-3-25 10:37:10 | 只看該作者
Self-Affine SurfacesThe study of self-affine surfaces forms the basis for the continuum study of all thin film rough surfaces. It is in the context of self-affine surfaces where the description of the surface is simplest and most elegant, and the ideas used to describe self-affine surfaces can be generalized to more complex surfaces such as mounded surfaces.
23#
發(fā)表于 2025-3-25 14:15:04 | 只看該作者
Matthew Pelliccione,Toh-Ming LuPresents basic modeling and simulation tools for quantitative description of thin film morphological evolution.Displays clear conceptual developments in the fundamental understanding of complex surfac
24#
發(fā)表于 2025-3-25 16:35:43 | 只看該作者
Springer Series in Materials Sciencehttp://image.papertrans.cn/e/image/317766.jpg
25#
發(fā)表于 2025-3-25 22:18:03 | 只看該作者
26#
發(fā)表于 2025-3-26 02:16:07 | 只看該作者
978-1-4419-2580-0Springer-Verlag New York 2008
27#
發(fā)表于 2025-3-26 05:47:21 | 只看該作者
Evolution of Thin Film Morphology978-0-387-75109-2Series ISSN 0933-033X Series E-ISSN 2196-2812
28#
發(fā)表于 2025-3-26 11:26:52 | 只看該作者
0933-033X elopments in the fundamental understanding of complex surfacThin?lmdepositionisthemostubiquitousandcriticaloftheprocessesusedto manufacture high-tech devices such as microprocessors, memories, solar cells, microelectromechanicalsystems(MEMS),lasers,solid-statelighting,andp- tovoltaics. The morpholog
29#
發(fā)表于 2025-3-26 13:50:53 | 只看該作者
https://doi.org/10.1007/978-3-322-89153-2vement to a more concrete and accurate model. In this chapter, we discuss a new growth model based on small world network dynamics that will serve as an example of how to analyze a continuum growth model.
30#
發(fā)表于 2025-3-26 20:18:33 | 只看該作者
https://doi.org/10.1007/978-3-663-20379-7ed in modeling thin film growth. More complicated models, including ballistic aggregation models, have been of interest as well, but illustrating the formulation and use of solid-on-solid models first gives insight into the advantages and drawbacks of both types of models. For more discussion regarding solid-on-solid models, see [40].
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