找回密碼
 To register

QQ登錄

只需一步,快速開(kāi)始

掃一掃,訪問(wèn)微社區(qū)

打印 上一主題 下一主題

Titlebook: Emerging Nanotechnologies; Test, Defect Toleran Mohammad Tehranipoor Book 2008 Springer-Verlag US 2008 CMOS.Nanotechnologie.Nanotube.Techno

[復(fù)制鏈接]
樓主: Harding
41#
發(fā)表于 2025-3-28 18:10:33 | 只看該作者
Book 2008e to achieve their functionality...Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field..
42#
發(fā)表于 2025-3-28 19:51:05 | 只看該作者
The valley grassland vegetation strategy requires determining what defect rates are tolerable ., i.e., is there some level of defects beyond which constructing circuits is not practical? If we can accommodate defects, how much area overhead is required and how is it affected by choice of circuit geometry? This chapter is an empirical exploration of these questions.
43#
發(fā)表于 2025-3-29 00:40:52 | 只看該作者
Lifestyles Envisioned with Backcasting,nistic fabrication processes and dominance of quantum effects at such scale. Dealing with such high defect densities requires wide research on new test and defect tolerance techniques that they are able to provide high defect tolerance while the amount of area overhead and test/configuration time are kept reasonable.
44#
發(fā)表于 2025-3-29 03:39:11 | 只看該作者
45#
發(fā)表于 2025-3-29 10:18:44 | 只看該作者
46#
發(fā)表于 2025-3-29 12:46:07 | 只看該作者
47#
發(fā)表于 2025-3-29 16:14:16 | 只看該作者
H. Malissa,M. Grasserbauer,R. Belchere significantly different from those in electronic circuits. In fact, the 2003 International Technology Roadmap for Semiconductors (ITRS) recognizes the need for new test methods for disruptive device technologies that underly composite microsystems, and highlights it as one of the five difficult test challenges beyond 2009 [6].
48#
發(fā)表于 2025-3-29 22:48:47 | 只看該作者
Defect-Tolerant Logic with Nanoscale Crossbar Circuits strategy requires determining what defect rates are tolerable ., i.e., is there some level of defects beyond which constructing circuits is not practical? If we can accommodate defects, how much area overhead is required and how is it affected by choice of circuit geometry? This chapter is an empirical exploration of these questions.
49#
發(fā)表于 2025-3-29 23:57:08 | 只看該作者
50#
發(fā)表于 2025-3-30 07:33:28 | 只看該作者
 關(guān)于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務(wù)流程 影響因子官網(wǎng) 吾愛(ài)論文網(wǎng) 大講堂 北京大學(xué) Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點(diǎn)評(píng) 投稿經(jīng)驗(yàn)總結(jié) SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學(xué) Yale Uni. Stanford Uni.
QQ|Archiver|手機(jī)版|小黑屋| 派博傳思國(guó)際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-5 09:16
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權(quán)所有 All rights reserved
快速回復(fù) 返回頂部 返回列表
巴东县| 建昌县| 南京市| 剑川县| 呼和浩特市| 泰来县| 平顺县| 鄱阳县| 饶阳县| 砀山县| 格尔木市| 新平| 来凤县| 项城市| 怀仁县| 蒲城县| 莱西市| 斗六市| 习水县| 景谷| 玛沁县| 咸宁市| 西盟| 昌吉市| 新建县| 荥经县| 泽州县| 孝义市| 孝感市| 桂阳县| 安岳县| 天水市| 安吉县| 纳雍县| 涞源县| 昌江| 合江县| 洞口县| 上饶县| 东方市| 甘孜县|