Titlebook: Emerging Nanotechnologies; Test, Defect Toleran Mohammad Tehranipoor Book 2008 Springer-Verlag US 2008 CMOS.Nanotechnologie.Nanotube.Techno

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H. Malissa,M. Grasserbauer,R. Belcher. More recently, new test techniques for mixed-technology microelectromechanical systems (MEMS) are also receiving attention [1–5]. As MEMS rapidly evolve from single components to highly integrated systems for safety-critical applications, dependability is emerging as an important performance param

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0929-1296 CMOS technology and may require a completely new architecture to achieve their functionality...Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field..978-1-4419-4513-6978-0-387-74747-7Series ISSN 0929-1296

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Coffee, Poverty, and Environmenttive circuits has drawn attention in recent years. The advantages of delay-insensitive circuits include flexible timing requirement,low power, high modularity, etc. These characteristics fit the needs of nanoscale computing. Cellular arrays have an ideal architecture for implementing delay-insensiti

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Menuka Udugama,U. K. Jayasinghe-Mudaligeendous constraints on total power dissipation and device reliability. On the device integration front, there is hope that hybrid systems will emerge, combining CMOS FETbased digital logic with any number of alternative devices, ranging from analog circuits, to more exotic alternatives (optical sourc

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Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systetive circuits has drawn attention in recent years. The advantages of delay-insensitive circuits include flexible timing requirement,low power, high modularity, etc. These characteristics fit the needs of nanoscale computing. Cellular arrays have an ideal architecture for implementing delay-insensiti

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Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fieldsendous constraints on total power dissipation and device reliability. On the device integration front, there is hope that hybrid systems will emerge, combining CMOS FETbased digital logic with any number of alternative devices, ranging from analog circuits, to more exotic alternatives (optical sourc