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Titlebook: Electronics Packaging Forum; Volume Two James E. Morris Book 1991 Van Nostrand Reinhold 1991 circuit.development.electrical overstress (EOS

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書(shū)目名稱Electronics Packaging Forum
副標(biāo)題Volume Two
編輯James E. Morris
視頻videohttp://file.papertrans.cn/307/306477/306477.mp4
圖書(shū)封面Titlebook: Electronics Packaging Forum; Volume Two James E. Morris Book 1991 Van Nostrand Reinhold 1991 circuit.development.electrical overstress (EOS
描述Each May, the Continuing Education Division of the T.J.Watson School of Engineering, Applied Science and Technology at the State University of New York at Binghamton sponsors an Annual Symposium in Electronics Packaging in cooperation with local professional societies (IEEE, ASME, SME, IEPS) and UnlPEG (the University-Industry Partnership for Economic Growth.) Each volume of this Electronics Packaging Forum series is based on the the preceding Symposium, with Volume Two based on the 1990 presentations. The Preface to Volume One included a brief definition of the broad scope of the electronics packaging field with some comments on why it has recently assumed such a more prominent priority for research and development. Those remarks will not be repeated here; at this point it is assumed that the reader is a professional in the packaging field, or possibly a student of one of the many academic disciplines which contribute to it. It is worthwhile repeating the series objectives, however, so the reader will be clear as to what might be expected by way of content and level of each chapter.
出版日期Book 1991
關(guān)鍵詞circuit; development; electrical overstress (EOS); electronics; heat; material; photon
版次1
doihttps://doi.org/10.1007/978-94-009-0439-2
isbn_softcover978-94-010-6681-5
isbn_ebook978-94-009-0439-2
copyrightVan Nostrand Reinhold 1991
The information of publication is updating

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Recent Developments in Thermal Technology for Electronics Packaging,at transfer techniques. This has been especially true in the evolution of electronics packaging for digital computers. Since the development of the first electronic digital computers in the 1940s, the removal of heat has played a major role in ensuring their reliable operation. Early digital compute
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Diamond Thin Films: Applications in Electronics Packaging,terial known to humanity, diamond scores high on almost all the categories of engineering properties such as thermal conductivity, electrical resistivity, and dielectric constant as summarized in Table 7.1. The combination of these outstanding properties makes diamond very attractive as the engineer
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Electrostatic and Electrical Overstress Damage in Silicon Mosfet Devices and Gaas Mesfet Structuresically financial) forces which continue to fuel this process have also brought about several technological advances. The reduction in transit time which results from reduced component size has led to improved gains and switching times [e.g. 1]. Smaller components require less external circuitry and,
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