書目名稱 | Electron Energy-Loss Spectroscopy in the Electron Microscope | 編輯 | Ray F. Egerton | 視頻video | http://file.papertrans.cn/307/306110/306110.mp4 | 圖書封面 |  | 描述 | Electron energy-loss spectroscopy (EELS or ELS) has been used to investi- gate the physical properties of solids for over 40 years in a handful of laboratories distributed around the world. More recently, electron micro- scopists have become interested in EELS as a method of chemical analysis with the potential for achieving very high sensitivity and spatial resolution, and there is a growing awareness of the fact that the loss spectrum can provide structural information from a thin specimen. In comparison with energy-dispersive x-ray spectroscopy, for example, EELS is a fairly demand- ing technique, requiring for its full exploitation a knowledge of atomic and solid-state physics, electron optics, and electronics. In writing this book, I have tried to gather together relevant information from these various fields. Chapter 1 begins at an elementary level; readers with some experience in EELS will be familiar with the content of the first two sections. Chapter 2 deals with instrumentation and experimental technique, and should con- tain material of interest to researchers who want to get the best performance out of commercial equipment as well as those who contemplate building their | 出版日期 | Book 1995 | 關(guān)鍵詞 | Energy-dispersive X-ray spectroscopy; X-ray spectroscopy; electron optics; spectra; spectroscopy | 版次 | 1 | doi | https://doi.org/10.1007/978-1-4615-6887-2 | isbn_ebook | 978-1-4615-6887-2 | copyright | Springer-Verlag US 1995 |
The information of publication is updating
|
|