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Titlebook: Electron Energy-Loss Spectroscopy in the Electron Microscope; Ray F. Egerton Book 1995 Springer-Verlag US 1995 Energy-dispersive X-ray spe

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書目名稱Electron Energy-Loss Spectroscopy in the Electron Microscope
編輯Ray F. Egerton
視頻videohttp://file.papertrans.cn/307/306110/306110.mp4
圖書封面Titlebook: Electron Energy-Loss Spectroscopy in the Electron Microscope;  Ray F. Egerton Book 1995 Springer-Verlag US 1995 Energy-dispersive X-ray spe
描述Electron energy-loss spectroscopy (EELS or ELS) has been used to investi- gate the physical properties of solids for over 40 years in a handful of laboratories distributed around the world. More recently, electron micro- scopists have become interested in EELS as a method of chemical analysis with the potential for achieving very high sensitivity and spatial resolution, and there is a growing awareness of the fact that the loss spectrum can provide structural information from a thin specimen. In comparison with energy-dispersive x-ray spectroscopy, for example, EELS is a fairly demand- ing technique, requiring for its full exploitation a knowledge of atomic and solid-state physics, electron optics, and electronics. In writing this book, I have tried to gather together relevant information from these various fields. Chapter 1 begins at an elementary level; readers with some experience in EELS will be familiar with the content of the first two sections. Chapter 2 deals with instrumentation and experimental technique, and should con- tain material of interest to researchers who want to get the best performance out of commercial equipment as well as those who contemplate building their
出版日期Book 1995
關(guān)鍵詞Energy-dispersive X-ray spectroscopy; X-ray spectroscopy; electron optics; spectra; spectroscopy
版次1
doihttps://doi.org/10.1007/978-1-4615-6887-2
isbn_ebook978-1-4615-6887-2
copyrightSpringer-Verlag US 1995
The information of publication is updating

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rience in EELS will be familiar with the content of the first two sections. Chapter 2 deals with instrumentation and experimental technique, and should con- tain material of interest to researchers who want to get the best performance out of commercial equipment as well as those who contemplate building their978-1-4615-6887-2
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Electron Energy-Loss Spectroscopy in the Electron Microscope
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Electron Energy-Loss Spectroscopy in the Electron Microscope978-1-4615-6887-2
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Quantitative Analysis of the Energy-Loss Spectrum,cal composition of a specimen. Although this information is expressed fairly directly in the energy-loss spectrum, plural scattering complicates the data recorded from specimens of typical thickness. It is therefore desirable to remove the effects of plural scattering from the spectrum or at least make allowance for them in the analysis procedure.
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Sale: The Final Contract in HPSM,In this final chapter, we discuss how the instrumentation, theory and techniques described earlier are used to obtain practical information from electron-microscope specimens. The general sequence will be: low-loss spectroscopy, core-loss spectroscopy, energy-filtered imaging, and analysis of fine structure in the energy-loss spectrum.
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