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Titlebook: Electron Backscatter Diffraction in Materials Science; Adam J. Schwartz,Mukul Kumar,Brent L. Adams Book 20001st edition Springer Science+B

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21#
發(fā)表于 2025-3-25 04:22:54 | 只看該作者
Romina Posch,Christian Alexander Scherb the limitations with respect to accuracy. Experiments were carried out to measure orientation fields from a silicon single crystal. The orientation dispersion was 1°. Disorientation correlation maps revealed anisotropy in the spatial variation in measured orientation.
22#
發(fā)表于 2025-3-25 10:58:24 | 只看該作者
Alexander A. Ignatiev,Alexander V. Lyashenkoere, the EBSD technique has proven to be essential. An example of this is studies of recrystallization where approximately 33% of the papers published in the proceedings of the recent international conference (REX′99, 1999) contain EBSD data.
23#
發(fā)表于 2025-3-25 14:27:46 | 只看該作者
Psychosoziale Faktoren der HIV-Infektion,ed as a reference image, or better, that produced by a dedicated forward scattered electron detector. Examples of the use of the camera, image and EBSD data are given to illustrate the Oxford Instruments EBSD system capabilities.
24#
發(fā)表于 2025-3-25 18:17:46 | 只看該作者
Heuristik im Mathematikunterrichtarch, characterization of deformed materials has been a significant fraction of the EBSD applications research published in the open literature. This chapter focuses on the application of EBSD to the characterization of deformed materials.
25#
發(fā)表于 2025-3-25 20:27:13 | 只看該作者
https://doi.org/10.1007/978-3-642-71010-0de information from submicrometer sized phases, but require the preparation of electron transparent samples that is very difficult and time intensive. Phase identification using EBSD is a complementary technique to TEM methods.
26#
發(fā)表于 2025-3-26 02:35:21 | 只看該作者
Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope,de information from submicrometer sized phases, but require the preparation of electron transparent samples that is very difficult and time intensive. Phase identification using EBSD is a complementary technique to TEM methods.
27#
發(fā)表于 2025-3-26 05:32:36 | 只看該作者
Book 20001st editionsuch texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the
28#
發(fā)表于 2025-3-26 11:26:37 | 只看該作者
29#
發(fā)表于 2025-3-26 14:00:15 | 只看該作者
Three-Dimensional Orientation Imaging,ere, the EBSD technique has proven to be essential. An example of this is studies of recrystallization where approximately 33% of the papers published in the proceedings of the recent international conference (REX′99, 1999) contain EBSD data.
30#
發(fā)表于 2025-3-26 20:10:42 | 只看該作者
An Automated EBSD Acquisition and Processing System,ed as a reference image, or better, that produced by a dedicated forward scattered electron detector. Examples of the use of the camera, image and EBSD data are given to illustrate the Oxford Instruments EBSD system capabilities.
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