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Titlebook: Electron Backscatter Diffraction in Materials Science; Adam J. Schwartz,Mukul Kumar,Brent L. Adams Book 20001st edition Springer Science+B

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發(fā)表于 2025-3-21 18:40:41 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱Electron Backscatter Diffraction in Materials Science
編輯Adam J. Schwartz,Mukul Kumar,Brent L. Adams
視頻videohttp://file.papertrans.cn/307/306080/306080.mp4
圖書封面Titlebook: Electron Backscatter Diffraction in Materials Science;  Adam J. Schwartz,Mukul Kumar,Brent L. Adams Book 20001st edition Springer Science+B
描述Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can appr
出版日期Book 20001st edition
關(guān)鍵詞EBSD explained; backscattered electron generation; crystal; deformation; diffraction; elastic strains; ele
版次1
doihttps://doi.org/10.1007/978-1-4757-3205-4
isbn_ebook978-1-4757-3205-4
copyrightSpringer Science+Business Media New York 2000
The information of publication is updating

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Theoretical Framework for Electron Backscatter Diffraction, exploring radiation must be smaller than the size of the microstructural units themselves. Electrons are ideal for such combined microstructural/crystallographic studies and indeed until the 1980s transmission electron microscopy (TEM) was the major technique used for such work, with some input fro
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Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope,y to obtain crystallographic information about the unknown while observing the microstructure or morphology of the specimen. Electron backscatter diffraction (EBSD) is a technique that can provide identification of unknown crystalline phases while exploiting the excellent imaging capabilities of the
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EBSD: Buying a System,articles provide a snapshot of the state-of-the-art hardware and software capabilities at the beginning of the year 2000. However, things are changing very rapidly in this new and exciting field. EBSD is very important. It will revolutionize scanning electron microscopy for all applications that inv
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