Titlebook: Defect and Fault Tolerance in VLSI Systems; Volume 2 C. H. Stapper,V. K. Jain,G. Saucier Book 1990 Springer Science+Business Media New York

Insensate

Anthrp

安撫

羞辱

https://doi.org/10.1007/978-3-319-49823-2ontrol are solved in a natural way by energy efficient and robust neural systems. Hopfield in his seminal paper [1] on physical systems with emergent computational abilities envisioned a new breed of integrated circuits that could implement such systems and would be much less sensitive to element fa

neuron

Yield Models - Comparative Studyabilities. This situation is due, among other things, to the fact that yield models are very often evaluated by using very different, and not always explicitly defined, evaluation criteria. The goal of this paper is to indicate a number of simple yield model characteristics which could be used to improve comparison of different yield models.

門閂

Extended Duplex Fault Tolerant System With Integrated Control Flow Checkinglume, power consumption and dissipation often lead to difficult problems. In other respects, if duplex architectures allow to reduce some of these problems, they do not provide the same availability characteristics.

Tidious

離開可分裂

Reliability Analysis of Application-Specific Architectureso failure due to metal electromigration will be diminished by a factor of α. [1]. In addition, an increase in clock rate requires that nodes be charged and discharged more rapidly, increasing the switching current in some technologies.

DAMN

Fault Tolerance in Analog VLSI: Case Study of a Focal Plane Processorcomputational abilities envisioned a new breed of integrated circuits that could implement such systems and would be much less sensitive to element failure than present day computers. Analog VLSI is a technology suitable for the implementation of synthetic neural systems [2, 3] on silicon.

NAUT