Titlebook: Defect and Fault Tolerance in VLSI Systems; Volume 2 C. H. Stapper,V. K. Jain,G. Saucier Book 1990 Springer Science+Business Media New York

Novice

書目名稱Defect and Fault Tolerance in VLSI Systems影響因子(影響力)




書目名稱Defect and Fault Tolerance in VLSI Systems影響因子(影響力)學(xué)科排名




書目名稱Defect and Fault Tolerance in VLSI Systems網(wǎng)絡(luò)公開度




書目名稱Defect and Fault Tolerance in VLSI Systems網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Defect and Fault Tolerance in VLSI Systems被引頻次




書目名稱Defect and Fault Tolerance in VLSI Systems被引頻次學(xué)科排名




書目名稱Defect and Fault Tolerance in VLSI Systems年度引用




書目名稱Defect and Fault Tolerance in VLSI Systems年度引用學(xué)科排名




書目名稱Defect and Fault Tolerance in VLSI Systems讀者反饋




書目名稱Defect and Fault Tolerance in VLSI Systems讀者反饋學(xué)科排名

完成

意見一致

Afflict

Dendritic-Cells

江湖郎中

江湖郎中

PLIC

HAIL

CRT-Pacing Only Versus CRT-DefibrillatorA large number of reconfiguration schemes have been presented for defect tolerant mesh arrays. Here a number of such schemes will be compared. Area and speed based measures are presented, along with a summary of the methods required to estimate area overhead, processor utilization, yield and speed.

kindred

The Effect on Yield of Clustering and Radial Variations in Defect DensityThis work examines the effect on yield, of the clustering and radial variation of fatal defects. An expression is developed for fatal defects as a function of chip area and distance of the chip from the edge of the wafer, and used to estimate the yield of successively larger numbers of array segments of a bipolar SRAM.