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Titlebook: Contemporary Trends in Semiconductor Devices; Theory, Experiment a Rupam Goswami,Rajesh Saha Book 2022 The Editor(s) (if applicable) and Th

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發(fā)表于 2025-3-23 11:19:44 | 只看該作者
Dennis T. Brown,Raquel Hernandezso discussed in detail. Furthermore, the challenges currently faced by researchers in developing Flexible DSSCs (FDSSCs) are also addressed. Therefore, the main objective of this book chapter is to discuss the different materials and synthesis techniques for developing a novel photoanode layer. Anot
12#
發(fā)表于 2025-3-23 15:16:10 | 只看該作者
https://doi.org/10.1007/978-1-4614-1120-8f tunnel FET significantly. Using Technology Computer Aided Design (TCAD) simulations, detailed examination on the impact of variations in lateral straggling parameters (.) for a hetero-stacked source tunnel FET (HSS-TFET) is carried out. The chapter focuses on the investigation of Analog/RF figure
13#
發(fā)表于 2025-3-23 21:36:16 | 只看該作者
14#
發(fā)表于 2025-3-23 22:35:07 | 只看該作者
https://doi.org/10.1007/978-1-4614-1281-6 three times the Debye length. An electro-mechanical system has been developed which can place the reference electrode in the desired position with an accuracy of 0.126?μm. The chapter presents the experimental results to support the theory associated with the optimal positioning of the reference el
15#
發(fā)表于 2025-3-24 05:00:27 | 只看該作者
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發(fā)表于 2025-3-24 07:25:24 | 只看該作者
17#
發(fā)表于 2025-3-24 12:11:24 | 只看該作者
https://doi.org/10.1007/978-1-4614-1281-6 which is defined as kink effect. The release of cumulated holes by using a small buried oxide gap in the SELBOX device and L-patterned trench in the DTD TFET attenuates kink. The DTD device becomes more economic and reliable due to its small device area compared to body contact-based devices. The s
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發(fā)表于 2025-3-24 17:42:39 | 只看該作者
19#
發(fā)表于 2025-3-24 22:03:55 | 只看該作者
Lecture Notes in Electrical Engineeringhttp://image.papertrans.cn/c/image/236758.jpg
20#
發(fā)表于 2025-3-25 01:54:03 | 只看該作者
Contemporary Trends in Semiconductor Devices978-981-16-9124-9Series ISSN 1876-1100 Series E-ISSN 1876-1119
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