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Titlebook: Computer-Aided Design and VLSI Device Development; Kit Man Cham,Soo-Young Oh,Daeje Chin Book 1988Latest edition Kluwer Academic Publishers

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31#
發(fā)表于 2025-3-26 23:18:20 | 只看該作者
The Evolution of Complex Hunter-Gatherers illustrate the usefulness and necessity of using computer-aided design tools in the fabrication of VLSI devices. First, the problem of high electric field in VLSI devices and the use of LDD device as a possible solution is discussed. The fabrication and simulation of LDD device is then described. F
32#
發(fā)表于 2025-3-27 02:45:45 | 只看該作者
33#
發(fā)表于 2025-3-27 07:32:17 | 只看該作者
Individual CRPS Case Management,s is reduced significantly. Island width/space design rules are becoming very aggressive, in the range of 1 .m/1 .m [11.1]. This means that the width of the isolation structures has to be scalable without causing field leakage problems. Also, as the transistor widths are scaled down, to the range of
34#
發(fā)表于 2025-3-27 12:43:47 | 只看該作者
35#
發(fā)表于 2025-3-27 13:42:50 | 只看該作者
36#
發(fā)表于 2025-3-27 21:02:43 | 只看該作者
37#
發(fā)表于 2025-3-27 21:59:59 | 只看該作者
38#
發(fā)表于 2025-3-28 03:15:27 | 只看該作者
Methodology in Computer-Aided Design for Process and Device Development Hewlett-Packard Laboratories. In this chapter, CAD is discussed from the user point of view. The methodology for using the simulation tools in the most effective way is presented. Then case studies will be presented in the following chapters which show in detail how simulation tools are used in device designs.
39#
發(fā)表于 2025-3-28 08:59:51 | 只看該作者
Transistor Design for Submicron CMOS Technologynology will first be discussed. Then the concerns for the design of n- and p-channel MOSFET’s with submicron channel lengths will be discussed. Using simulations, the values of the critical device parameters are determined which will minimize leakage problems in submicron transistors.
40#
發(fā)表于 2025-3-28 13:07:13 | 只看該作者
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