SCIE期刊JOURNAL OF ELECTRONIC IMAGING 2024/2025影響因子:1.177 (J ELECTRON IMAGING) (1017-9909). (ENGINEERING, ELECTRICAL & EL

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Submitted on: 18 January 2022. Revised on: 06 March 2022. Accepted on: 14 April 2022. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

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Submitted on: 10 April 2018. Revised on: 19 July 2018. Accepted on: 08 August 2018. ___________________JOURNAL OF ELECTRONIC IMAGING---SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

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