Titlebook: Atomic Scale Interconnection Machines; Proceedings of the 1 Christian Joachim Conference proceedings 2012 Springer-Verlag Berlin Heidelberg

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Nanometer-Scale Four-Point Probe Resistance Measurements of Individual Nanowires by Four-Tip STM,tudies with two different samples, Co-silicide nanowires self-assembled on Si(110) surface and Cu nanowires made by damascene processes used in LSI industry. It is shown that the four-tip STM with CNT tips is versatile and powerful for measuring the conductivity of individual nanostructures.