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Titlebook: Atomic Scale Interconnection Machines; Proceedings of the 1 Christian Joachim Conference proceedings 2012 Springer-Verlag Berlin Heidelberg

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樓主: energy
51#
發(fā)表于 2025-3-30 10:02:52 | 只看該作者
Probing Single Molecular Motors on Solid Surface, construction of complex devices at single molecular scale. In this chapter, two different kinds of single molecular motors at surfaces are studied with scanning tunneling microscopy (STM) technique. We discuss the structural and conductance transitions of one H2 rotaxane molecule at the sub-rotaxan
52#
發(fā)表于 2025-3-30 14:33:51 | 只看該作者
2193-9691 rcuit.Includes supplementary material: This volume documents the first International Workshop on Atomic Scale Interconnection Machines organised by the European Integrated Project AtMol in June 2011 in Singapore. The four sessions, discussed here in revised contributions by high level speakers, span
53#
發(fā)表于 2025-3-30 18:04:50 | 只看該作者
L O K - Das Wunder von Leipzig?,ctrical probing has the potential to increase efficiency in evaluating different approaches. To meet the involved requirements, we have established and being advancing an approach for nano-scale electrical probing at low temperatures by integrating scanned probe microscopic (SPM) technology with high resolution electron microscopy.
54#
發(fā)表于 2025-3-30 23:46:35 | 只看該作者
temperature scanning tunneling microscope (Multiprobe), high resolution scanning electron microscope (SEM). The fabrication part has field ion microscope (FIM), evaporators and nanoimprinter. The characteristics of every part of the instrument and the preliminary experiments on Si(100) surface are discussed.
55#
發(fā)表于 2025-3-31 00:57:57 | 只看該作者
Fu?ballfans als politische Akteur*innenthat operates under a scanning electron microscope in ultra-high vacuum and fulfills these requirements thanks to a unique control system. We show how this instrument is well adapted to study the resistivity of semiconductor nanowires.
56#
發(fā)表于 2025-3-31 08:41:05 | 只看該作者
Christa Kleindienst-Cachay,Steffen Bahlke 1.3?eV close to that of a Si(100)H surface. Two tip surface I–V measurements were performed by varying the inter-tip distance down to 100?nm. A transition from nonlinear to linear I–V characteristics are seen when the 2 tip separation is below 1?μm.
57#
發(fā)表于 2025-3-31 10:39:43 | 只看該作者
Kerstin P??iger,S?hnke Vosgerautudies with two different samples, Co-silicide nanowires self-assembled on Si(110) surface and Cu nanowires made by damascene processes used in LSI industry. It is shown that the four-tip STM with CNT tips is versatile and powerful for measuring the conductivity of individual nanostructures.
58#
發(fā)表于 2025-3-31 14:16:55 | 只看該作者
High Precision Local Electrical Probing: Potential and Limitations for the Analysis of Nanocontactsctrical probing has the potential to increase efficiency in evaluating different approaches. To meet the involved requirements, we have established and being advancing an approach for nano-scale electrical probing at low temperatures by integrating scanned probe microscopic (SPM) technology with high resolution electron microscopy.
59#
發(fā)表于 2025-3-31 18:54:48 | 只看該作者
60#
發(fā)表于 2025-3-31 23:33:27 | 只看該作者
Combined STM and Four-Probe Resistivity Measurements on Single Semiconductor Nanowires,that operates under a scanning electron microscope in ultra-high vacuum and fulfills these requirements thanks to a unique control system. We show how this instrument is well adapted to study the resistivity of semiconductor nanowires.
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