期刊全稱 | Applied Scanning Probe Methods I | 影響因子2023 | Bharat Bhushan,Harald Fuchs,Sumio Hosaka | 視頻video | http://file.papertrans.cn/161/160115/160115.mp4 | 發(fā)行地址 | First book summarizing the state-of-the-art of this technique.Real industrial applications included.Includes supplementary material: | 學(xué)科分類 | NanoScience and Technology | 圖書封面 |  | 影響因子 | .This volume examines the physical and technical foundation for recent progress in applied?near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.. | Pindex | Book 2004 |
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