Titlebook: Ageing of Integrated Circuits; Causes, Effects and Basel Halak Book 2020 Springer Nature Switzerland AG 2020 Analog IC Reliability.Aging E

whiplash

書目名稱Ageing of Integrated Circuits影響因子(影響力)




書目名稱Ageing of Integrated Circuits影響因子(影響力)學(xué)科排名




書目名稱Ageing of Integrated Circuits網(wǎng)絡(luò)公開度




書目名稱Ageing of Integrated Circuits網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Ageing of Integrated Circuits被引頻次




書目名稱Ageing of Integrated Circuits被引頻次學(xué)科排名




書目名稱Ageing of Integrated Circuits年度引用




書目名稱Ageing of Integrated Circuits年度引用學(xué)科排名




書目名稱Ageing of Integrated Circuits讀者反饋




書目名稱Ageing of Integrated Circuits讀者反饋學(xué)科排名

大量殺死

Intrepid

Critique and Its Postnational Aftermath The random and unique start-up values (SUVs) of SRAM-PUF can be used as a cryptographic key. Nevertheless, asymmetric NBTI stress may cause errors in SUVs. As the error in the SUVs increases resulting in an increasing area overhead of error correction code (ECC) which is needed to generate an error

Lobotomy

linear

GLIDE

模仿

ciliary-body

Ageing Mitigation Techniques for SRAM Memories The random and unique start-up values (SUVs) of SRAM-PUF can be used as a cryptographic key. Nevertheless, asymmetric NBTI stress may cause errors in SUVs. As the error in the SUVs increases resulting in an increasing area overhead of error correction code (ECC) which is needed to generate an error

puzzle

故意釣到白楊