Titlebook: Advanced Computing in Electron Microscopy; Earl J. Kirkland Book 2020Latest edition Springer Nature Switzerland AG 2020 fast fourier proje

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Sampling and the Fast Fourier Transform,o try no special answers to the questions which possess us — unless it be to suggest that we sit quietly in a room. Eventually, I suppose, we will have to look at that sense of oppression itself: such feelings can come from a truth about ourselves which we are holding off.

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the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.978-3-030-33262-4978-3-030-33260-0

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https://doi.org/10.1007/978-3-030-61463-8ors used to focus the electrons in the microscope are discussed. Various approximations used in modeling the microscope are introduced. Optical aberrations are defined, and general methods of aberration correction are described briefly.

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https://doi.org/10.1007/978-3-030-61463-8a simple intuitive approach to interpreting the electron micrographs although it might not be particularly accurate. Some image models naturally lead into nonlinear effects, which are less intuitive but unavoidable.

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Book 2020Latest editionraphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

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