Titlebook: Advanced Computing in Electron Microscopy; Earl J. Kirkland Book 2020Latest edition Springer Nature Switzerland AG 2020 fast fourier proje

只看該作者 · 發(fā)表于 2025-3-24 11:14:03

Earl J. KirklandFeatures in-depth coverage of numerical computation of electron microscopy images including multislice methods.Covers high resolution CTEM and STEM image interpretation.Addresses the latest developmen

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只看該作者 · 發(fā)表于 2025-3-24 20:32:13

https://doi.org/10.1007/978-3-030-61463-8t starts with the fundamental physics of electron dynamics for energies in the range 60–1000 keV. Some types of magnetic lenses and aberration correctors used to focus the electrons in the microscope are discussed. Various approximations used in modeling the microscope are introduced. Optical aberra

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