Titlebook: A Unified Approach for Timing Verification and Delay Fault Testing; Mukund Sivaraman,Andrzej J. Strojwas Book 1998 Springer Science+Busine

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A Unified Approach for Timing Verification and Delay Fault Testing

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nsure correct temporal behavior of modern-day digitalcircuits, both before and after fabrication. Research in(pre-fabrication) timing verification and (post-fabrication) delayfault testing has evolved along largely disjoint lines in spite of thefact that they share many basic concepts. ..A Unified A

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Inhibition of Recrystallizationng constraints. In such a scenario, it is imperative to verify the temporal behavior of such circuit designs before they are sent for fabrication. It is also equally important to test each fabricated chip to ensure that the circuit indeed performs correctly at the specified clock speed.

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Hans Raml?v,Dennis Steven Friis to have delay faults, it can be inferred that the circuit will exhibit correct temporal behavior for all input vectors regardless of delay faults on the rest of the paths. Various classifications of paths based on delay fault testability have been proposed in the literature (Figure 15).

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Hans Raml?v,Dennis Steven Friisn describe in Section 4.2 how our primitive PDF identification procedure from the previous chapter can be extended to compute this delay [108]. We discuss the advantages, limitations, and applicability of the . (.) strategy in Section 4.3 and Section 4.4. Results for benchmark circuits are presented in Section 4.5.

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Don Kulasiri,Rahul KosarwalHighlights the theory and applications of the chemical master equation (CME) for very large biochemical networks.Discusses the novel method comprehensively, underlining the interdisciplinary approach