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Titlebook: A Unified Approach for Timing Verification and Delay Fault Testing; Mukund Sivaraman,Andrzej J. Strojwas Book 1998 Springer Science+Busine

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期刊全稱A Unified Approach for Timing Verification and Delay Fault Testing
影響因子2023Mukund Sivaraman,Andrzej J. Strojwas
視頻videohttp://file.papertrans.cn/143/142545/142545.mp4
圖書(shū)封面Titlebook: A Unified Approach for Timing Verification and Delay Fault Testing;  Mukund Sivaraman,Andrzej J. Strojwas Book 1998 Springer Science+Busine
影響因子Large system complexities and operation under tight timingconstraints in rapidly shrinking technologies have made it extremelyimportant to ensure correct temporal behavior of modern-day digitalcircuits, both before and after fabrication. Research in(pre-fabrication) timing verification and (post-fabrication) delayfault testing has evolved along largely disjoint lines in spite of thefact that they share many basic concepts. ..A Unified Approach for Timing Verification and Delay FaultTesting. applies concepts developed in the context of delay faulttesting to path sensitization, which allows an accurate timinganalysis mechanism to be developed. This path sensitization strategyis further applied for efficient delay fault diagnosis and delay faultcoverage estimation. .A new path sensitization strategy called Signal Stabilization TimeAnalysis (SSTA) has been developed based on the fact that primitivePDFs determine the stabilization time of the circuit outputs. Thisanalysis has been used to develop a feasible method of identifying theprimitive PDFs in a general multi-level logic circuit. An approach todetermine the maximum circuit delay using this primitive PDFidentification mechanism is
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Hans Raml?v,Dennis Steven Friisput stabilizes to its final logic value. In other words, the maximum of the primitive PDF delays is a valid bound for the maximum circuit delay. We elaborate on this in Section 4.1, and prove that this in fact is exactly equal to the maximum circuit delay under the floating mode of operation. We the
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https://doi.org/10.1007/978-1-4614-3840-3elay testing, it is therefore judicious to select a manageable set of test patterns which test each fabricated chip for the presence of delay faults. If a fabricated chip passes a set of delay tests, the confidence one has in the absence of delay faults in the chip is a measure of the effectiveness
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