SCIE期刊IEEE Design & Test 2024/2025影響因子:1.909 (IEEE DES TEST) (2168-2356). (ENGINEERING, ELECTRICAL & ELECTRONIC)(工程，電氣和

PAGAN

Indigence

Submitted on: 30 August 2010. Revised on: 24 October 2010. Accepted on: 20 November 2010. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

挫敗

Submitted on: 02 January 2004. Revised on: 15 February 2004. Accepted on: 05 March 2004. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Original

Submitted on: 03 January 2014. Revised on: 16 February 2014. Accepted on: 01 March 2014. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

DAUNT

動(dòng)物

Submitted on: 25 July 2000. Revised on: 07 November 2000. Accepted on: 17 December 2000. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

禍害隱伏

Submitted on: 23 November 2021. Revised on: 15 March 2022. Accepted on: 23 April 2022. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

卷發(fā)

Submitted on: 17 February 2016. Revised on: 16 May 2016. Accepted on: 26 June 2016. ___________________IEEE Design & Test---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

陳舊

engagement