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Titlebook: Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge; Tübingen, September G. M?llenstedt,K

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書目名稱Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge
副標(biāo)題Tübingen, September
編輯G. M?llenstedt,K. H. Gaukler
視頻videohttp://file.papertrans.cn/986/985099/985099.mp4
圖書封面Titlebook: Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongre? für R?ntge; Tübingen, September  G. M?llenstedt,K
描述The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal- lurgy, mineralogy, and biology. An exhibition showing
出版日期Conference proceedings 1969
關(guān)鍵詞Mikroanalyse; Wellen; X-ray; astronomy; density; diffraction; diffusion; electron; energy; fields; lens; metals
版次1
doihttps://doi.org/10.1007/978-3-662-12108-5
isbn_softcover978-3-662-12110-8
isbn_ebook978-3-662-12108-5
copyrightSpringer-Verlag Berlin Heidelberg 1969
The information of publication is updating

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Resolution Error Correction of Small Angle Scattering Data Using Hermite Functionsicated structure. The most general information we can draw from elastic isotropic small angle scattering is contained in the correlation function . (.) as the spatial Fourier transform of the scattering function .(.), where . = 47 · sin (./2)/... is the scattering angle and A the wavelength.
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Recent Progress of Electron Microprobe in Japanse the electron microprobe itself is nearly completed. However, from an urgent request of practical field some new improvements have been done. Therefore the next step or progress would be found in the related field.
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Présentation d’un programme de calcul sur ordinateur des diverses corrections à appliquer aux analyses expressions analytiques classiques ont été employées sauf en ce qui concerne le facteur de rétrodiffusion . dont la formule est originale. Ce formalisme de calcul, vérifié expérimentalement, permet d’effectuer les corrections d’analyses d’échantillons contenant jusqu’à 12 éléments, avec une convergence rapide vers la solution.
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in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific
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