找回密碼
 To register

QQ登錄

只需一步,快速開始

掃一掃,訪問微社區(qū)

打印 上一主題 下一主題

Titlebook: VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability; 24th IFIP WG 10.5/IE Thomas Hollstein,Jaan Raik,Ricar

[復制鏈接]
查看: 28158|回復: 48
樓主
發(fā)表于 2025-3-21 16:16:28 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability
副標題24th IFIP WG 10.5/IE
編輯Thomas Hollstein,Jaan Raik,Ricardo Reis
視頻videohttp://file.papertrans.cn/981/980130/980130.mp4
概述Includes supplementary material:
叢書名稱IFIP Advances in Information and Communication Technology
圖書封面Titlebook: VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability; 24th IFIP WG 10.5/IE Thomas Hollstein,Jaan Raik,Ricar
描述This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016.?The 11 papers included in the book were carefully reviewed and selected from the 36 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address?the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design..
出版日期Conference proceedings 2017
關鍵詞application-specific integrated circuit (ASIC); applied computing; chip integration; computer architect
版次1
doihttps://doi.org/10.1007/978-3-319-67104-8
isbn_softcover978-3-319-88379-3
isbn_ebook978-3-319-67104-8Series ISSN 1868-4238 Series E-ISSN 1868-422X
issn_series 1868-4238
copyrightIFIP International Federation for Information Processing 2017
The information of publication is updating

書目名稱VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability影響因子(影響力)




書目名稱VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability影響因子(影響力)學科排名




書目名稱VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability網絡公開度




書目名稱VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability網絡公開度學科排名




書目名稱VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability被引頻次




書目名稱VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability被引頻次學科排名




書目名稱VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability年度引用




書目名稱VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability年度引用學科排名




書目名稱VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability讀者反饋




書目名稱VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability讀者反饋學科排名




單選投票, 共有 0 人參與投票
 

0票 0%

Perfect with Aesthetics

 

0票 0%

Better Implies Difficulty

 

0票 0%

Good and Satisfactory

 

0票 0%

Adverse Performance

 

0票 0%

Disdainful Garbage

您所在的用戶組沒有投票權限
沙發(fā)
發(fā)表于 2025-3-21 23:32:25 | 只看該作者
板凳
發(fā)表于 2025-3-22 00:38:33 | 只看該作者
1868-4238 gy and advanced research. They address?the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design..978-3-319-88379-3978-3-319-67104-8Series ISSN 1868-4238 Series E-ISSN 1868-422X
地板
發(fā)表于 2025-3-22 06:17:08 | 只看該作者
Enabling Internet-of-Things with Opportunities Brought by Emerging Devices, Circuits and Architectu has become the key concern, which relies on innovations from all levels of device, circuits, and architectures. Meanwhile, the energy efficiency of existing IoT implementations based on the CMOS technology is fundamentally limited by the device physics and also the circuits and systems built on it.
5#
發(fā)表于 2025-3-22 09:04:58 | 只看該作者
,Logic with Unipolar Memristors – Circuits and Design Methodology,ance, which is controlled by the voltage or current applied to them. The resistance state of a memristor is nonvolatile, and as such makes memristors attractive candidates for use as novel memory elements. Apart from their use for memory applications, the use of memristors in logic circuits is widel
6#
發(fā)表于 2025-3-22 14:31:38 | 只看該作者
7#
發(fā)表于 2025-3-22 18:00:56 | 只看該作者
8#
發(fā)表于 2025-3-23 00:12:58 | 只看該作者
9#
發(fā)表于 2025-3-23 03:21:15 | 只看該作者
Improving the Efficiency of Formal Verification: The Case of Clock-Domain Crossings,lish the functional correctness of all clock-domain crossings (CDCs) in a system-on-chip (SoC), semi-automatic approaches require non-trivial manual deductive reasoning. In contrast, our approach produces a small sequence of easy queries to the user. The key idea is to use counterexample-guided abst
10#
發(fā)表于 2025-3-23 09:16:02 | 只看該作者
Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs,vices that may result in early life failures. Devices used in safety critical environments must undergo this phase that is usually accomplished by exploiting the Burn-In (BI) process. Unfortunately, BI has elevated costs for companies and current state of the art techniques are trying to reduce its
 關于派博傳思  派博傳思旗下網站  友情鏈接
派博傳思介紹 公司地理位置 論文服務流程 影響因子官網 吾愛論文網 大講堂 北京大學 Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點評 投稿經驗總結 SCIENCEGARD IMPACTFACTOR 派博系數 清華大學 Yale Uni. Stanford Uni.
QQ|Archiver|手機版|小黑屋| 派博傳思國際 ( 京公網安備110108008328) GMT+8, 2025-10-7 20:46
Copyright © 2001-2015 派博傳思   京公網安備110108008328 版權所有 All rights reserved
快速回復 返回頂部 返回列表
嘉兴市| 禄丰县| 故城县| 涪陵区| 斗六市| 湛江市| 行唐县| 阜城县| 康保县| 双城市| 渑池县| 雷山县| 剑河县| 祁阳县| 镇安县| 宣武区| 壶关县| 仙居县| 永吉县| 鱼台县| 东兰县| 美姑县| 治县。| 武城县| 长子县| 轮台县| 荥经县| 高唐县| 建平县| 昌邑市| 光泽县| 兴海县| 呈贡县| 扬州市| 龙陵县| 桃园市| 花莲县| 大田县| 武山县| 沭阳县| 赣榆县|