找回密碼
 To register

QQ登錄

只需一步,快速開始

掃一掃,訪問微社區(qū)

打印 上一主題 下一主題

Titlebook: VLSI-SoC: Research Trends in VLSI and Systems on Chip; Fourteenth Internati Giovanni Micheli,Salvador Mir,Ricardo Reis Conference proceedin

[復制鏈接]
樓主: patch-test
51#
發(fā)表于 2025-3-30 08:43:00 | 只看該作者
52#
發(fā)表于 2025-3-30 14:09:52 | 只看該作者
Library Compatible Variational Delay Computation,ing concern. Process variations have immediate impact on circuit performance and behavior and standard design and signoff methodologies have to account for such variability. In this context, timing verification, already a challenging task due to the sheer complexity of todays designs, becomes an inc
53#
發(fā)表于 2025-3-30 19:36:21 | 只看該作者
54#
發(fā)表于 2025-3-30 21:05:53 | 只看該作者
Frequency and Speed Setting for Energy Conservation in Autonomous Mobile Robots,ivors after a disaster. Mobile robots usually carry limited energy (mostly rechargeable batteries) so energy conservation is crucial. In a mobile robot, the processor and the motors are two major energy consumers. While a robot is moving, it has to detect an obstacle before a collision. This results
55#
發(fā)表于 2025-3-31 02:16:40 | 只看該作者
Configurable On-Line Global Energy Optimization in Multi-Core Embedded Systems Using Principles of encies of multiple processing elements (PE), tailored to the instantaneous workload information and is fully adaptive to variations in process and temperature. The circuit design borrows some of the basic principles of analog computation to continuously optimize the system-wide energy dissipation of
56#
發(fā)表于 2025-3-31 05:41:47 | 只看該作者
57#
發(fā)表于 2025-3-31 11:20:51 | 只看該作者
58#
發(fā)表于 2025-3-31 14:33:18 | 只看該作者
CAT Platform for Analogue and Mixed-Signal Test Evaluation and Optimization,its. The CAT platform, integrated in the Cadence Design Framework Environment, includes tools for fault simulation, test generation and test optimization for these types of circuits. Fault modeling and fault injection are simulator independent, which makes this approach flexible with respect to past
59#
發(fā)表于 2025-3-31 20:58:17 | 只看該作者
Broadside Transition Test Generation for Partial Scan Circuits through Stuck-at Test Generation,t of a given partial scan circuit into some combinational circuits. Then, by performing stuck-at test generation on the transformed circuits, broadside transition tests for the original circuit are obtained. This method allows us to use existing stuck-at test generation tools in order to generate br
60#
發(fā)表于 2025-3-31 22:34:22 | 只看該作者
 關于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務流程 影響因子官網(wǎng) 吾愛論文網(wǎng) 大講堂 北京大學 Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點評 投稿經(jīng)驗總結 SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學 Yale Uni. Stanford Uni.
QQ|Archiver|手機版|小黑屋| 派博傳思國際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-5 01:18
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權所有 All rights reserved
快速回復 返回頂部 返回列表
高唐县| 腾冲县| 湟中县| 班戈县| 阿坝县| 张家界市| 姚安县| 荆门市| 安龙县| 彝良县| 临洮县| 鹰潭市| 大竹县| 灵武市| 上思县| 孝感市| 武功县| 灌阳县| 福安市| 分宜县| 桦南县| 施秉县| 清原| 沅陵县| 涞水县| 明光市| 阿克陶县| 沂南县| 临洮县| 景东| 江油市| 玉田县| 许昌市| 宜宾市| 龙江县| 宁远县| 扶沟县| 曲靖市| 琼中| 松桃| 宜兰县|