Titlebook: VLSI Design and Test for Systems Dependability; Shojiro Asai Book 2019 Springer Japan KK, part of Springer Nature 2019 CREST Program.Error

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Challenges and Opportunities in VLSI for Systems Dependability redundancies have been extensively studied. To go further, challenges of 3-D integration, chip-area (on-chip and across-chip) network, and wireless packaging have been taken on. Exploiting the potential of VLSI in solving problems in systems that call for hard real-time response and/or synchronicit